Rad Effects Analysis

Ridgetop maintains a staff that is skilled in the evaluation of radiation on microelectronics and complex systems.

Examples include:

  • Under contract from a large Prime Contractor, Ridgetop analyzed the rad effects of body tie impedance for a commercial 90nm CMOS process. Ridgetop acquired the Process Design Kit (PDK) and other information, then performed various TCAD simulations and prepared a complete vulnerability report for the customer.
  • Another Prime Contractor needed an independent assessment as to the rad hardness of a component to be used in a space satellite. Specifically, the issue was to determine the life of a space-deployed camera, given a certain number of orbits, a defined LEO orbital path and expected radiation flux. Ridgetop performed the Independent Analysis and provided the report to the customer.

Why do you need Ridgetop die-level test structures?

We provide in-situ measurement solutions for IC applications. When you can monitor key parameter variation and performance degradation, you can take corrective or preventive action much faster and more easily.

Fabless Semiconductor
Design House

Was it a design problem or a process/foundry problem?

Ridgetop’s PDKChek® die-level test structure provides independent verification of foundry-supplied parameters.

Process-aware designs

Ridgetop’s PDKChek provides in-situ measurements to correct for parametric variations in the die, improving production yields and major savings!

Customer Service

Reach our staff from 8:00AM to 5:00PM (MST).

520-742-3300 (p)
520-544-3180 (f)




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